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论文类型：期刊论文

发表时间：2018-07-06

发表刊物：INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING

收录刊物：SCIE

卷号：115

期号：1

页面范围：99-116

ISSN号：0029-5981

关键字：geometric uncertainty; polynomial chaos expansion; random field; random threshold model; reliability; topology optimization

摘要：This paper develops a new reliability-based topology optimization framework considering spatially varying geometric uncertainties. Geometric imperfections arising from manufacturing errors are modeled with a random threshold model. The projection threshold is represented by a memoryless transformation of a Gaussian random field, which is then discretized by means of the expansion optimal linear estimation. The structural response and their sensitivities are evaluated with the polynomial chaos expansion, and the accuracy of the proposed method is verified by Monte Carlo simulations. The performance measure approach is adopted to tackle the reliability constraints in the reliability-based topology optimization problem. The optimized designs obtained with the present method are compared with the deterministic solutions and the reliability-based design considering random variables. Numerical examples demonstrate the efficiency of the proposed method.