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基于声压反射系数功率谱测量超声在薄层介质中往返时间的方法

Release Time:2019-03-09  Hits:

First Author: 林莉

Disigner of the Invention: 李喜孟,LUO Zhongbing,陈军,胡志雄

Application Number: CN201210051117.3

Authorization Date: 2012-02-29

Authorization Number: CN102607479A

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