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基于压电阻抗法的热障涂层热生长氧化层无损检测方法

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First Author:Lin Li

Disigner of the Invention:李继承,chenjun,LUO Zhongbing,liximeng,leimingkai

Application Number:CN201110179939.5

Authorization Date:2011-06-30

Authorization number:CN102353700A

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