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基于压电阻抗法的热障涂层热生长氧化层无损检测方法

Release Time:2022-10-20  Hits:

First Author: 林莉

Disigner of the Invention: 李继承,陈军,LUO Zhongbing,李喜孟,雷明凯

Institution: 材料科学与工程学院

Application Number: CN102353700A

Authorization Number: CN201110179939.5

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