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基于压电阻抗法的热障涂层热生长氧化层无损检测方法

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First Author:Lin Li

Disigner of the Invention:李继承,chenjun,LUO Zhongbing,liximeng,leimingkai

Affilication of Author(s):材料科学与工程学院

Application Number:CN102353700A

Authorization number:CN201110179939.5

Pre One:基于声压反射系数功率谱测量薄层声阻抗和声衰减的方法

Next One:航空雷达罩蒙皮涂层厚度超声测量专用探头
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