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基于声压反射系数功率谱测量薄层声阻抗和声衰减的方法

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First Author:Lin Li

Disigner of the Invention:胡志雄,chenjun,LUO Zhongbing,liximeng

Affilication of Author(s):材料科学与工程学院

Application Number:CN102608212A

Authorization number:CN201210049984.3

Pre One:建立铸造奥氏体不锈钢等轴晶声学特性计算模型的方法

Next One:基于压电阻抗法的热障涂层热生长氧化层无损检测方法
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