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基于声压反射系数功率谱测量薄层声阻抗和声衰减的方法

Release Time:2022-10-20  Hits:

First Author: 林莉

Disigner of the Invention: 胡志雄,陈军,LUO Zhongbing,李喜孟

Institution: 材料科学与工程学院

Application Number: CN102608212A

Authorization Number: CN201210049984.3

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