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An Improved SRGAN-based Deblurring Model for Multiple Blurriness in Microscopy

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Date of Publication:2024-11-09

Journal:IEEE Transactions on Instrumentation and Measurement

ISSN No.:0018-9456

Key Words:Adversarial networks; Convolution neural network; Deblurring; Edge sharpness; Frequency domains; Image deblurring; Key Issues; Multiple blurriness; Perceptual quality; Property

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