Release Time:2024-12-24  Hits:

Date of Publication: 2024-11-09

Journal: IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Key Words: Adversarial networks; Convolution neural network; Deblurring; Edge sharpness; Frequency domains; Image deblurring; Key Issues; Multiple blurriness; Perceptual quality; Property