location: Current position: Home >> Scientific Research >> Paper Publications

Surface analysis of photolithographic patterns using ToF-SIMS and PCA

Hits:

Indexed by:Journal Papers

Date of Publication:2009-01-01

Journal:Surface and Interface Analysis

Included Journals:Scopus

Volume:41

Issue:8

Page Number:645-652

Pre One:Imaging analysis of carbohydrate-modified surfaces using tof-SIMS and spri

Next One:神经干细胞球生长动力学模型