周平

个人信息Personal Information

教授

博士生导师

硕士生导师

性别:男

毕业院校:大连理工大学

学位:博士

所在单位:机械工程学院

学科:机械制造及其自动化

办公地点:大连理工大学机械工程学院知方楼5009

联系方式:pzhou@dlut.edu.cn

电子邮箱:pzhou@dlut.edu.cn

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铜电致化学抛光抛光液的成分及其作用

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发表时间:2022-10-09

发表刊物:机械工程学报

期号:5

页面范围:88-94

ISSN号:0577-6686

摘要:Electrogenerated chemical polishing (EGCP) is a new, stress-free polishing method. Stress free polishing of workpiece surface is realized by diffusion controlled chemical reaction and etchant is generated by electrochemical reaction on electrode surface. The components of polishing solution are the key factors to realize the diffusion controlled reaction and controllable material removal process. The basic principle of EGCP is analyzed, and the basic characteristics of polishing solution are proposed according to the theoretical analysis. For realizing EGCP of Cu, the FeSO4(redox mediator), H2SO4 (pH adjusting agent) and BTA (lateral charge propagation inhibitor) are chosen as the polishing solution. Through analyzing the surface components of polished workpiece by XPS and XRD, the action mechanisms of H2SO4 and BTA are studied. The results show that the H2SO4 is benefit to promoting the etching reaction through removing the Cu oxide layer. BTA can be adsorbed on the Cu surface, and then suppresses surface lateral charge propagation.

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