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个人信息Personal Information
教授
博士生导师
硕士生导师
主要任职:材料科学与工程学院副院长
性别:男
毕业院校:大连理工大学
学位:博士
所在单位:材料科学与工程学院
学科:材料学
办公地点:知远楼B515(新材料大楼)
电子邮箱:zhaoning@dlut.edu.cn
Effect of Electromigration on the Type of Drop Failure of Sn-3.0Ag-0.5Cu Solder Joints in PBGA Packages
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论文类型:期刊论文
发表时间:2015-10-01
发表刊物:JOURNAL OF ELECTRONIC MATERIALS
收录刊物:SCIE、EI、Scopus
卷号:44
期号:10
页面范围:3927-3933
ISSN号:0361-5235
关键字:Board level drop reliability; electromigration; Sn-3.0Ag-0.5Cu; surface finish; PBGA package; intermetallic compound
摘要:Board-level drop tests of plastic ball grid array (PBGA) packages were performed in accordance with the Joint Electron Devices Engineering Council standard to investigate the effect of electromigration (EM) on the drop reliability of Sn-3.0Ag-0.5Cu solder joints with two substrate surface finishes, organic solderability preservative (OSP) and electroless nickel electroless palladium immersion gold (ENEPIG). In the as-soldered state, drop failures occurred at the substrate sides only, with cracks propagating within the interfacial intermetallic compound (IMC) layer for OSP solder joints and along the IMC/Ni-P interface for ENEPIG solder joints. The drop lifetime of OSP solder joints was approximately twice that of ENEPIG joints. EM had an important effect on crack formation and drop lifetime of the PBGA solder joints. ENEPIG solder joints performed better in drop reliability tests after EM, that is, the drop lifetime of ENEPIG joints decreased by 43% whereas that of OSP solder joints decreased by 91%, compared with the as-soldered cases. The more serious polarity effect, i.e., excessive growth of the interfacial IMC at the anode, was responsible for the sharper decrease in drop lifetime. The different types of drop failure of PBGA solder joints before and after EM, including the position of initiation and the propagation path of cracks, are discussed on the basis of the growth behavior of interfacial IMC.