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个人信息Personal Information
教授
博士生导师
硕士生导师
主要任职:材料科学与工程学院副院长
性别:男
毕业院校:大连理工大学
学位:博士
所在单位:材料科学与工程学院
学科:材料学
办公地点:知远楼B515(新材料大楼)
电子邮箱:zhaoning@dlut.edu.cn
Current-induced interfacial reactions in Ni/Sn-3Ag-0.5Cu/Au/Pd(P)/Ni-P flip chip interconnect
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论文类型:期刊论文
发表时间:2011-12-01
发表刊物:JOURNAL OF MATERIALS RESEARCH
收录刊物:Scopus、SCIE、EI
卷号:26
期号:24
页面范围:3009-3019
ISSN号:0884-2914
摘要:The current-induced interfacial reactions in the Ni/Sn-3.0Ag-0.5Cu/Au/Pd(P)/Ni-P (ENEPIG) flip chip interconnects and the failure mechanism during electromigration (EM) were reported. When ENEPIG was the cathode, EM significantly enhanced the consumption of Ni-P leaving a Ni3P layer; once the Ni-P was completely consumed, the growth of Ni2SnP was accelerated. The dissolved Ni atoms from the Ni-P and the interfacial intermetallic compounds (IMCs) were driven toward the anode upon electron current stressing and precipitated as large (Ni, Cu)(3)Sn-4 IMCs. The excessive consumption of Ni-P and the formation of voids were responsible for the EM-induced failures. When Ni was the cathode, the rapid localized dissolutions of Ni under bump metallization (UBM) and Cu pad in the current crowding region resulted in a two-stage transformation of interfacial IMCs at the opposite Ni-P/solder interface. The localized dissolutions of Ni UBM and Cu pad on chip, as well as the formation of voids, were responsible for the EM-induced failures.