Journal:JOURNAL OF MATERIALS PROCESSING TECHNOLOGY
Volume:299
ISSN No.:0924-0136
Key Words:"Silicon wafer; Residual height; Grinding marks; Wafer shape; Model"
Date of Publication:2022-10-02
zhuxianglong
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Gender:Male
Alma Mater:大连理工大学
Paper Publications
Effect of grinding residual height on the surface shape of ground wafer
Date of Publication:2022-10-02 Hits: