邹赫麟

个人信息Personal Information

教授

博士生导师

硕士生导师

性别:男

毕业院校:威尔大学

学位:博士

所在单位:机械工程学院

学科:微机电工程

办公地点:机械工程学院2号楼214-2

联系方式:办公电话:0411-84709754

电子邮箱:zouhl@dlut.edu.cn

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Fabrication of a P-type Sb2Te3 and N-type Bi2Te3 thin film thermocouple

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论文类型:会议论文

发表时间:2001-06-08

收录刊物:Scopus、EI

页面范围:314-317

摘要:A thin film Sb2Te3-Bi2Te3 based thermocouple was fabricated. P-type antimony telluride thin films and n-type bismuth telluride thin films have been deposited by co-evaporation on to glass substrates. The conditions for deposition have been investigated as a function of substrate temperature (Ts) and flux ratio (Fr = F(Te)/F(Sb,Bi)) and optimised to achieve a high thermoelectric power factor. The qualities of deposited films, e.g. structure, composition and morphology, have been examined by X-ray diffraction (XRD), energy dispersive X-ray analysis (EDXA), flame atomic absorption spectroscopy (FAAS) and atomic force microscope (AFM). The thermoelectric properties of the thin films have been studied by room temperature measurement of the Seebeck coefficient, Hall coefficient and electrical resistivity. It has been observed that the Seebeck coefficient and electrical conductivity of p-type Sb2Te3 thin film (  p,   p) and n-type Bi2Te3 thin films (  n,   n) were found to be about 185   V/K, 0.32    103   -1 cm-1 and -228   V/K, 0.77    103   -1 cm-1, respectively. From optimal deposition parameters, a thin film thermocouple was fabricated and operated in Peltier mode. The observed maximum value for temperature difference between hot and cold end is about 15 K for a current of 50 mA. The results indicate that good quality antimony telluride and bismuth telluride thin films grown by co-evaporation are promising candidates for use in a micro-Peltier module.