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Indexed by:期刊论文
Date of Publication:2010-09-01
Journal:JOURNAL OF PHYSICS-CONDENSED MATTER
Included Journals:SCIE、EI
Volume:22
Issue:34
ISSN No.:0953-8984
Abstract:Ferromagnetic ordering at room temperature (RTFM) in MgO thin films deposited by RF magnetron sputtering under various atmospheric conditions and temperatures is reported. A saturation magnetization (MS) value as high as 1.58 emu g(-1) is (0.046 mu B/unit cell) observed for a 170 nm film deposited at RT under an oxygen pressure of 1.3 x 10(-4) mbar. In contrast, films deposited at elevated temperature (under an identical oxygen pressure), or at higher oxygen pressures, as well as under a nitrogen atmosphere at RT show significantly suppressed magnetization. The ferromagnetic order in the MgO matrix is believed to be defect induced.