Release Time:2019-03-10 Hits:
Indexed by: Conference Paper
Date of Publication: 2006-07-24
Volume: Vol.37
Page Number: 324-325
Key Words: 多孔InP;电化学刻蚀;耗尽层;场强化效应;扫描电子显微镜
Abstract: 利用扫描电子显微镜(SEM)对电化学刻蚀多孔InP的形貌进行了表征,用耗尽层模型和场强化效应模型讨论了多孔InP刻蚀的机制.
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