Thermal conductivity measurement of the He-ion implanted layer of W using transient thermoreflectance technique
Release Time:2019-03-12 Hits:
Indexed by: Journal Article
Date of Publication: 2017-02-01
Journal: JOURNAL OF NUCLEAR MATERIALS
Included Journals: Scopus、EI、SCIE
Volume: 484
Page Number: 382-385
ISSN: 0022-3115
Abstract: Transient thermoreflectance method was applied on the thermal conductivity measurement of the surface damaged layer of He-implanted tungsten. Uniform damages tungsten surface layer was produced by multi-energy He-ion implantation with thickness of 450 nm. Result shows that the thermal conductivity is reduced by 90%. This technique was further applied on sample with holes on the surface, which was produced by the He-implanted at 2953 K. The thermal conductivity decreases to 3% from the bulk value. (C) 2016 Elsevier B.V. All rights reserved.