Hits:

Indexed by:期刊论文

Date of Publication:2017-02-01

Journal:JOURNAL OF NUCLEAR MATERIALS

Included Journals:SCIE、EI、Scopus

Volume:484

Page Number:382-385

ISSN No.:0022-3115

Abstract:Transient thermoreflectance method was applied on the thermal conductivity measurement of the surface damaged layer of He-implanted tungsten. Uniform damages tungsten surface layer was produced by multi-energy He-ion implantation with thickness of 450 nm. Result shows that the thermal conductivity is reduced by 90%. This technique was further applied on sample with holes on the surface, which was produced by the He-implanted at 2953 K. The thermal conductivity decreases to 3% from the bulk value. (C) 2016 Elsevier B.V. All rights reserved.