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Indexed by:期刊论文

Date of Publication:2011-02-15

Journal:PHYSICA B-CONDENSED MATTER

Included Journals:Scopus、SCIE、EI

Volume:406

Issue:4

Page Number:818-823

ISSN No.:0921-4526

Key Words:ZnO; Thin film; Thermal conductivity; Transient thermoreflectance

Abstract:Thermal conductivities (TCs) of ZnO thin films of thickness 80-276 nm prepared by sol-gel method are measured by the transient thermoreflectance (TTR) system. The obtained TCs ranging from 1.4 to 6.5 W/m K decrease while the thickness decrease. The measured TCs are much smaller than those of bulk ZnO, which is about 100 IN/En K. The possible reasons for the decrease are the grain boundary and defects. The latter is the dominating one from the analysis. (C) 2010 Published by Elsevier B.V.