Release Time:2019-03-09  Hits:

Indexed by: Journal Article

Date of Publication: 2011-02-15

Journal: PHYSICA B-CONDENSED MATTER

Included Journals: EI、SCIE、Scopus

Volume: 406

Issue: 4

Page Number: 818-823

ISSN: 0921-4526

Key Words: ZnO; Thin film; Thermal conductivity; Transient thermoreflectance

Abstract: Thermal conductivities (TCs) of ZnO thin films of thickness 80-276 nm prepared by sol-gel method are measured by the transient thermoreflectance (TTR) system. The obtained TCs ranging from 1.4 to 6.5 W/m K decrease while the thickness decrease. The measured TCs are much smaller than those of bulk ZnO, which is about 100 IN/En K. The possible reasons for the decrease are the grain boundary and defects. The latter is the dominating one from the analysis. (C) 2010 Published by Elsevier B.V.