教授 博士生导师 硕士生导师
性别: 男
毕业院校: 北京邮电大学
学位: 博士
所在单位: 控制科学与工程学院
学科: 微电子学与固体电子学. 光学工程
电子邮箱: huihuang@dlut.edu.cn
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论文类型: 期刊论文
发表时间: 2011-09-01
发表刊物: NANO LETTERS
收录刊物: Scopus、SCIE、EI
卷号: 11
期号: 9
页面范围: 3941-3945
ISSN号: 1530-6984
关键字: Nanowire; quantum dots; MOCVD; adatom diffusion; critical diameter; zinc blende
摘要: In As quantum dots (QDs) are grown epitaxially on Au-catalyst-grown GaAs nanowires (NWs) by metal organic chemical vapor deposition (MOCVD). These QDs are about 10-30 nm in diameter and several nanometers high, formed on the {112} side facets of the GaAs NWs. The QDs are very dense at the base of the NW and gradually sparser toward the top until disappearing at a distance of about 2 mu m from the base. It can be concluded that these QDs are formed by adatom diffusion from the substrate as well as the sidewalls of the NWs. The critical diameter of the GaAs NW that is enough to form InAs QDs is between 120 and 160 nm according to incomplete statistics. We also find that these QDs exhibit zinc blende (ZB) structure that is consistent with that of the GaAs NW and their edges are faceted along particular surfaces. This hybrid structure may pave the way for the development of future nanowire-based optoelectronic devices.