Thermal conductivity measurement of the He-ion implanted layer of W using transient thermoreflectance technique
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论文类型：期刊论文
发表时间：2017-02-01
发表刊物：JOURNAL OF NUCLEAR MATERIALS
收录刊物：Scopus、EI、SCIE
卷号：484
页面范围：382-385
ISSN号：0022-3115
摘要：Transient thermoreflectance method was applied on the thermal conductivity measurement of the surface damaged layer of He-implanted tungsten. Uniform damages tungsten surface layer was produced by multi-energy He-ion implantation with thickness of 450 nm. Result shows that the thermal conductivity is reduced by 90%. This technique was further applied on sample with holes on the surface, which was produced by the He-implanted at 2953 K. The thermal conductivity decreases to 3% from the bulk value. (C) 2016 Elsevier B.V. All rights reserved.