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论文类型：期刊论文

发表时间：2013-04-01

发表刊物：JOURNAL OF CRYSTAL GROWTH

收录刊物：SCIE、EI

卷号：368

页面范围：92-96

ISSN号：0022-0248

关键字：Cu substrates; Low temperature; ECR-PEMOCVD; GaN films

摘要：Highly c-axis oriented GaN films were deposited on Cu coated glass substrates using electron cyclotron resonance plasma enhanced metal organic chemical vapor deposition (ECR-PEMOCVD). In-situ reflection high energy electron diffraction (RHEED), X-ray diffraction (XRD) and atomic force microscopy (AFM) were used to systematically analyze the influence of TMGa flux on the crystalline quality of the GaN films. GaN films with strong c-axis preferred orientation were achieved under the optimal TMGa flux of 1.4 sccm. Moreover, a strong near band edge (NBE) emission peak located at 354 nm was observed in the room temperature PL spectrum for the optimized GaN sample. The GaN/Cu/glass structure shows great potential for application in large area low cost GaN-based LED devices. (C) 2013 Elsevier B.V. All rights reserved.