邹赫麟

个人信息Personal Information

教授

博士生导师

硕士生导师

性别:男

毕业院校:威尔大学

学位:博士

所在单位:机械工程学院

学科:微机电工程

办公地点:机械工程学院2号楼214-2

联系方式:办公电话:0411-84709754

电子邮箱:zouhl@dlut.edu.cn

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Characterization of Parylene C as protective layer on micro-piezoelectric printheads

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论文类型:期刊论文

发表时间:2015-12-01

发表刊物:MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

收录刊物:SCIE、EI、Scopus

卷号:40

页面范围:811-816

ISSN号:1369-8001

关键字:Parylene C; Piezoelectric inkjet printhead; Patterning etching; Adhesive strength

摘要:To prevent corrosion of PZT (Lead zirconate titanate) and electrodes in printheads as they are exposed to ink, Parylene C was selected as the protective layer. The deposition thickness, patterning method, and TGA (thermogravimetric analysis) of Parylene C, as well as its adhesive strength on the substrate and its aging property were studied experimentally. The results of the experiments showed that when the deposition thickness of Parylene C was 450 nm, it fully met the voltage-tolerance requirement, with a reduction in vibration displacement of only 12.89%. To pattern the Parylene C, the oxygen plasma etching method was employed, and the dependence of the etch rate on chamber power and chamber pressure were investigated. TGA experiments with Parylene C indicate that it can withstand the working temperature of a wire-bonding process. Pretreating the substrate with silane coupling agent improved the adhesive strength between Parylene C and the substrate significantly. The dielectric constant of Parylene C was reduced only 10% after 23 days in ink, which indicates the excellent aging resistance of Parylene C. (C) 2015 Elsevier Ltd. All rights reserved.