location: Current position: Home >> Scientific Research >> Paper Publications

Plasma Diagnosis for Microwave ECR Plasma Enhanced Sputtering Deposition of DLC Films

Hits:

Indexed by:期刊论文

Date of Publication:2012-02-01

Journal:PLASMA SCIENCE & TECHNOLOGY

Included Journals:SCIE、EI、Scopus

Volume:14

Issue:2

Page Number:172-176

ISSN No.:1009-0630

Key Words:floating harmonic probe; DLC films; microwave ECR plasma; Raman spectroscopy

Abstract:Application of the Langmuir probe in plasma circumstance for deposition of diamond-like carbon (DLC) thin films usually faces the problem of rapid failure of the probe due to surface insulative coating. In this paper, we circumvent the problem by using the floating harmonic probe technique. In the real circumstance of DLC film deposition, the floating harmonic probe worked reliably over 3 hours, correctly indicating the ion density and electron temperature. The technique was practically used to measure the ion density and electron temperature in DLC film deposition processes using the microwave ECR plasma enhanced sputtering. Combined with the Raman spectroscopic characterization of the films, the conditions for deposition of DLC films were investigated.

Pre One:Hydrogen plasma induced crystallization of Si thin films by remote inductively coupled plasma source assistant pulsed dc twin magnetron sputtering

Next One:Hydrogenated poly-crystalline silicon thin films deposited by inductively coupled plasma assisted pulsed dc twin magnetron sputtering