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Passivation of SiO2/4H-SiC interface defects via electron cyclotron resonance hydrogen-nitrogen mixed plasma pretreatment for SiC surface combined with post-oxidation annealing

Release Time:2022-10-08  Hits:

Date of Publication: 2022-10-07

Journal: APPLIED SURFACE SCIENCE

Volume: 364

Page Number: 769-774

ISSN: 0169-4332

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