Release Time:2019-03-12 Hits:
Indexed by: Journal Article
Date of Publication: 2015-01-01
Journal: 物理学报
Included Journals: ISTIC、PKU
Volume: 64
Issue: 16
Page Number: 166601-166601
Prev One:Effects of rare earth Ce addition on the microstructure, wettability and interfacial reactions of eutectic Sn-0.7Cu solder
Next One:Applications of synchrotron radiation real-time imaging technology in characterizing the reliability of micro bumps in electronic packaging(特邀报告)