location: Current position: Home >> Scientific Research >> Paper Publications

Formation of highly preferred orientation of β-Sn grains in solidified Cu/SnAgCu/Cu micro interconnects under temperature gradient effect

Hits:

Indexed by:Journal Papers

Date of Publication:2017-01-01

Journal:Applied Physics Letters

Volume:110

Issue:9

Page Number:93504-

Pre One:Dominant effect of Sn grain orientation on electromigration-induced failure mechanism of Sn-3.0Ag-0.5 Cu flip chip solder interconnects

Next One:Effect of Sn grain orientation on Ni substrate dissolution and intermetallic compounds precipitation in Cu/Sn/Ni interconnect undergoing electromigration