location: Current position: Home >> Scientific Research >> Paper Publications

Electromigration-induced β-Sn grain rotation in lead-free flip chip solder bumps

Hits:

Indexed by:会议论文

Date of Publication:2019-01-01

Page Number:2036-2041

Pre One:A Study on the Oxygen Plasma Treatment on the Peel Adhesion Strength and Solder Wettability of SnBi58 based Anisotropic Conductive Films

Next One:Effects of Electroplating Process Parameters on Properties of Co-electroplated Au-Sn alloy