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Dayu ZHOU
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Professor Supervisor of Doctorate Candidates Supervisor of Master's Candidates
Paper Publications
[41]Sun, Nana, xujin, Dayu ZHOU, Zhao, Peng, Li, Shuaidong, Wang, Jingjing, chushichao, Ali, Faizan.DC reactively sputtered TiNx thin films for capacitor electrodes[J],JOURNAL OF MATERIALS SCIENCE MATERIALS IN ELECTRONICS,2022,29(12):10170-10176
[42]Sun, Nana, Ali, Faizan, Dayu ZHOU, Shishuyan, Liu, Wenwen, Zhao Xiuming, liufeng, Tian, Zhongjie, Li, Shuaidong, Wang, Jingjing.DC substrate bias enables preparation of superior-performance TiN electrode films over a wide p...[J],MATERIALS RESEARCH BULLETIN,2022,119
[43]Vopson, M. M., Dayu ZHOU, Caruntu, G..Multicaloric effect in bi-layer multiferroic composites[J],APPLIED PHYSICS LETTERS,2022,107(18)
[44]Wang, Jingjing, Dayu ZHOU, dongwei, Yao, Yifan, sunnana, Ali, Faizan, houxiaoduo, liufeng.Optimizing Annealing Process for Ferroelectric Y-Doped HfO2 Thin Films by All-Inorganic Aqueous P...[J],ADVANCED ELECTRONIC MATERIALS,2022,7(2)
[45]Liang, Hailong, xujin, Dayu ZHOU, renshijiang.Phase transformation and dielectric properties of Y doped HfO2 thin films[J],JOURNAL OF ALLOYS AND COMPOUNDS,2022,861
[46]Li, Hongming, dongchuang, Zhao, Yajun, lixiaona, Dayu ZHOU.Quantitative Correlation between Electrical Resistivity and Microhardness of Cu-Ni-Mo Alloys vi...[J],JOURNAL OF ELECTRONIC MATERIALS,2022,48(1):312-320
[47]Ali, Faizan, Dayu ZHOU, Mohsin, Hafiz Waqas, Daaim, Muhammad, Khan, Sheeraz, Hussain, Muhammad Muzammal, Sun, Nana.Recent Progress on Energy-Related Applications of HfO2-Based Ferroelectric and Antiferroelectri...[J],ACS APPLIED ELECTRONIC MATERIALS,2022,2(8):2301-2317
[48]Knebel, Steve, Dayu ZHOU, Schroeder, Uwe, Slesazeck, Stefan, Pesic, Milan, Agaiby, Rimoon, Heitmann, Johannes, Mikolajick, Thomas.Reliability Comparison of ZrO2-Based DRAM High-k Dielectrics Under DC and AC Stress[J],IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,2022,17(2):324-330
[49]Dayu ZHOU, Mikolajick, T., Schroeder, U., xujin, Heitmann, J., Jegert, G., Weinreich, W., Kerber, M., Knebel, S., Erben, E..Reliability of Al2O3-doped ZrO2 high-k dielectrics in three-dimensional stacked metal-insulator...[J],JOURNAL OF APPLIED PHYSICS,2022,108(12)
[50]Ali, Faizan, Dong, Xianlin, Xiaohua Liu, Dayu ZHOU, Yang, Xirui, xujin, Schenk, Tony, Mueller, Johannes, Schroeder, Uwe, Cao, Fei.Silicon-doped hafnium oxide anti-ferroelectric thin films for energy storage[J],JOURNAL OF APPLIED PHYSICS,2022,122(14)
total125 5/13
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