Release Time:2024-09-10 Hits:
Indexed by: Journal Papers
Document Code: 396055
Date of Publication: 2024-10-10
Journal: JOURNAL OF ELECTRONIC MATERIALS
Volume: 53
Issue: si
Page Number: 6463-6470
ISSN: 0361-5235
Key Words: STRENGTH
Prev One:Mechanism on scalloped Cu6Sn5 grain refinement under interaction of Cu and Ni
Next One:Correlation between microhardness and microstructure of low-temperature Sn-xBi-M(Ag, Sb) solders