Current position: Home >> Scientific Research >> Paper Publications

Correlation between microhardness and microstructure of low-temperature Sn-xBi-M(Ag, Sb) solders

Release Time:2024-09-10  Hits:

Date of Publication: 2024-09-05

Journal: JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T

Volume: 31

Page Number: 165-169

ISSN: 2238-7854

Key Words: ADDITIONS; ALLOYS; BI-AG-CU; CREEP-BEHAVIOR; MECHANICAL-PROPERTIES; MIGRATION; SEGREGATION; SN-58BI SOLDER; ZN

Prev One:Effects of Mixed Percentage on the Microstructure and Mechanical Properties of Sn-52In/Sn-3.0Ag-0.5Cu Hybrid Solder Joints

Next One:Microstructural evolution and thermal fatigue reliability of Sn-Ag-Cu/Sn-Bi-Ag hybrid BGA solder joints assembled by low-temperature soldering