Release Time:2024-09-10 Hits:
Indexed by: Journal Papers
Document Code: 391560
Date of Publication: 2024-04-10
Journal: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume: 35
Issue: 12
ISSN: 0957-4522
Key Words: MICROSTRUCTURE
Prev One:Electromigration-induced failure behavior of low -temperature Cu/Sn-57Bi-1 Ag/Cu solder j oints
Next One:Mechanism on scalloped Cu6Sn5 grain refinement under interaction of Cu and Ni