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Date of Publication:2024-06-01
Journal:Applied Surface Science
Volume:665
ISSN No.:0169-4332
Key Words:4h-SiC; C-face; Cost effective; Cost effectiveness; Ductile fracture; Fracture toughness; Grinding (machining); Material removal mechanisms; Molecular dynamics; Morphology; Nano-grinding; Power devices; Radio frequency devices; Si faces; Silicon wafers; Single crystals; Surface characteristics; Surface materials; Surface morphology; Surface roughness