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Predictive models for the surface roughness and subsurface damage depth of semiconductor materials in precision grinding

Release Time:2026-03-29  Hits:

Indexed by: Journal Papers

Document Code: 478461

Date of Publication: 2025-06-01

Journal: INTERNATIONAL JOURNAL OF EXTREME MANUFACTURING

Volume: 7

Issue: 3

ISSN: 2631-8644

Key Words: BRITTLE MATERIALS; CERAMICS; CHIP THICKNESS; ELASTIC-MODULUS; FORCE; HARDNESS; PLASTIC INDENTATION DAMAGE; SILICON-WAFER

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